Session 5 | Theory + Practice! Transforming You from a Beginner to an Expert! From November 4th to 8th, a five-day offline skills training event for AI visual inspection system maintenance engineers was successfully held at Keye Technology’s facility. The training course adopted a “3+2” model, combining theory and hands-on practice, aimed at enabling employees […]
Author Archives: Keyeintel
KeyeTech Core Technology of Industrial Vision Inspection AI 2.0 Era – “Good Product Training Model” Keye Technology leads innovation, based on two modules of deep learning, supervised and unsupervised, combined with practical experience, to independently develop the core technology of Industrial Vision inspection AI 2.0 era – “Good Product Training Model”. It is divided into anomaly inspection and […]
Exhibition | Victor Machinery and Keye Technology Join Hands to Meet at the API International Pharmaceutical Exhibition in Golden Autumn October! In Golden Autumn October, Xi’an, China.The 91st China International Pharmaceutical Raw Materials/Intermediates/Packaging/Equipment Trade Fair grandly opens at the Xi’an International Convention and Exhibition Center.Victor Machinery and Keye Technology make a joint appearance.Exciting moments not to be […]
Visual Inspection Machine in the Pharmaceutical Industry | KeyeTech’s Eight Self-Developed Core Technologies Era of Industry 4.0 In the era of Industry 4.0, various sectors in our country are experiencing modernization and intelligent development trends. The demand for visual inspection machine to achieve high automation, high precision, and high efficiency is becoming widespread, especially in […]
High quality defect data is crucial for training and optimizing AI visual inspection models on industrial production lines. To obtain rare and high-quality defect samples for product appearance defect detection, multiple layers of effort are required. Artificially creating product defect samples – low authenticity! High yield rate and low defect rate, online collection of defect […]
Exciting Launch! KeyeTech Achieves New Breakthrough in Defect Generation In industrial production lines, high-quality defect data is crucial for training and optimizing AI visual inspection models. Obtaining rare, high-quality defect samples for product appearance defect detection requires multi-layered efforts. is an inevitable trend. Manually creating product defect samples—low authenticity! High yield rates and low defect […]
The Main Differences between Artificial Intelligence Algorithm and Traditional Algorithm In the past few years, the booming development of artificial intelligence technology has influenced and transformed many industries, and has a significant impact on the machine vision industry, providing new solutions for industrial defect detection. In the field of visual inspection, the main differences between […]
How to achieve integrated cooperation from bottle blowing to vision inspection control and automated packaging? On September 5th, the China (Cangzhou) Plastic Industry Expo grandly opened at the Cangzhou International Exhibition Center, gathering numerous heavyweight enterprises from the upstream and downstream of the plastic industry chain. Jiangsu Victor Machinery Co., Ltd. (hereinafter referred to as “Victor Machinery”), […]
Recently, the Anhui Provincial Department of Industry and Information Technology announced the sixth batch of specialized, refined, and new “XIAOJUREN” enterprise recognition list, and Anhui KeyeTech was awarded the “National Specialized, Refined, and New Little Giant Enterprise” for its AI visual inspection. Specialized and innovative “XIAOJUREN” enterprise It is recognized by the country as a […]
What’s is the customized process of visual inspection system? With the rapid implementation of artificial intelligence technology and the continuous development of the intelligent robot industry, visual inspection machines are unleashing even stronger vitality. The typical structure of visual inspection system design mainly consists of five parts, namely: lighting, lens, camera, image acquisition, and computing […]